Microanalysis

• Genesis X-ray microanalysis
- Genesis Apex
- Genesis Software

• EDS Detectors
- Apollo 40 SDD - Silicon Drift detector
- Apollo XV SDD - Silicon Drift detector
- Apollo 10 SDD - Silicon Drift detector
- The Sapphire Si(Li) Detecting Unit
- The r-TEM - High Performance TEM Detector

• Wavelength Dispersive X-ray Spectrometers (WDS)
- LEXS - Low Energy X-ray Spectrometer
- TEXS HP - Transition X-ray Spectrometer

• Integrated systems
- The Pegasus System
- The Neptune System
- The Trident System

• TSL Crystalography
- OIM™ data collection software
- OIM™ analysis software
- Specialized OIM™ Applications

• EBSD Detectors
– Hikari High Speed EBSD Detector
- Digiview IV Detector
- Integrated Forward Scatter Detector

• Micro-EDXRF
– Orbis Micro-XRF Analyser Series

For more information on any of the Microanalysis products detailed above, please contact the nanoTechnology Systems team on +61 3 9432 8932.