Apollo
XV SDD
The
Apollo XV SDD provides premium resolution and superior light
element performance using the latest SDD technology. The Apollo
XV Silicon Drift Detector (SDD) is the latest member of EDAX's
Apollo series SDD X-ray detectors and provides the follow
features:
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Latest
generation 10mm2 SDD chip technology |
|
Superior
low energy performance |
|
Reliable
LN2 free operation |
|
Superior
light element performance down to (and including) Boron |
|
The
ability to collect a full X-ray map in seconds |
|
Superior
qualitative and quantitative analysis |
The
Apollo XV SDD can be integrated into the current family of
EDAX X-ray microanalysis systems. The Apollo XV simply replaces
or compliments the current Si(Li) detecting units. Coupling
the Apollo SDD with the EDAX Genesis software provides the
user with complete capabilities for X-ray microanalysis.
The
Apollo XV SDD provides the user with the optimum EDS detector
for applications where the best energy resolution or low energy
performance is required. The performance of the Apollo XV
SDD enhances the accurate qualitative and quantitative analytical
capabilities of the Genesis XM systems, while also providing
solutions for high speed mapping. Improved precision and faster
analytical capabilities enable the user to generate results
with confidence.

 |
 |
High speed
X-ray map collected at 100,000 cps in 3 minutes by Apollo
XV SDD. |
For
more information on the Apollo XV SDD, please contact the
nanoTechnology Systems team on +61 3 9432 8932.
www.edax.com
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