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Apollo
40 SDD
The
Apollo 40 Silicon Drift Detector (SDD) when fully integrated
within the Genesis XM systems fulfills the promises of SDD
detectors by utilising the latest SDD technology to provide
the following features:
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Collection
efficiency over three times that of the best designed
10mm2 Si(Li), enabling the SDD to collect higher count
rates |
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Superior
light element performance down to (and including) Boron |
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Peak
position stability over the dynamic range of the detector |
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Superior
qualitative and quantitative analysis |
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Reliable
LN2 free operation |
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The
ability to collect a full X-ray map in seconds |
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High
throughput capability |
The
Apollo 40 SDD can be integrated into the current family of
EDAX X-ray microanalysis systems.The
Apollo 40 simply replaces or compliments the current Si(Li)
detecting units. Coupling the Apollo SDD with the EDAX Genesis
software provides the user with complete capabilities for
X-ray microanalysis.
The
Apollo 40 provides the user with at EDS detector for all applications,
from qualitative and quantitative analysis, to high speed
mapping and automated particle analysis. Improved precision
and faster analytical capabilities enable the user to generate
results with confidence.
For
more information on the Apollo 40 Silicon Drift Detector,
please contact the nanoTechnology Systems team on +61 3 9432
8932.
www.edax.com
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Gives thanks to nanoTechnology Systems!
