PW-EM ProbeWorkstation for SEM/FIB

The ProbeWorkstation is a system dedicated to electrical characterization of semiconductor devices and advanced materials. The optimal combination of Kleindieks nanomanipulation and probing products and a Keithley parameter analyzer provides you with a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements. The system is designed for measurements on 45 nm, 65 nm, 90 nm and larger technology and the flexibility to allow you to configure your probe workstation to meet your specific needs.

For more information on the PW-EM ProbeWorkstation, please contact the nanoTechnology Systems team on +61 3 9432 8932.

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