Quanta
200 3D
The
Quanta 3D assists engineers and researchers needing
to characterize materials, conduct failure analysis
or control processes in an industrial environment.
The
advantage of a Quanta 3D is its integrated micro-sectioning
capabilities allowing exploration of the specimen subsurface.
It combines traditional thermal emission Scanning Electron
Microscopy (SEM) with Focused Ion Beam (FIB) to extend
your applications range for 3D characterization and
nanoanalysis. The Quanta 3D's features include, automated
FIB sectioning recipes, customized detector geometries,
variable pressure vacuum system (ESEM™) and gas
chemistries for high-volume milling applications.
Quanta
3D represents a great value SEM/FIB, addressing the
requirements of industrial applications such as pharmaceutical,
automotive or analytical laboratories.


For
more information on the Quanta 200 3D, please contact
the nanoTechnology Systems team on +61 3 9432 8932.
www.fei.com
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