Helios NanoLab™

FEI's newest DualBeam™ the Helios NanoLab™ combines the most advanced scanning electron microscope (SEM) and focused ion beam (FIB) technologies. With unsurpassed SEM resolution, image quality and stunning Sidewinder™ FIB performance, imaging, milling or preparing samples is fast and easy for semiconductor and data storage labs, as well as industries and researchers facing today's most challenging applications.

Helios NanoLab™ is also unique because its automated sample preparation capabilities, using FEI's AutoTEM™ G2 software, yields thin samples that are prepared rapidly and with very high reliability. The Sidewinder FIB pioneers high-quality sample preparation using advanced endpointing and very low kV FIB cleaning, ideal for making localized samples for observation in high-resolution S/TEMs.

For more information on the Helios NanoLab™, please contact the nanoTechnology Systems team on +61 3 9432 8932.

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